tascon News

August 2011

Meet us at SIMS XIII

The latest developments in research an application of the SIMS technique will be discussed during this year's International SIMS Conference in Riva del Garda (September 18th - 23rd; www.simsxviii.org/). Tascon's Birgit Hagenhoff and Reinhard Kersting will attend and present our latest results on the characterisation of nanomaterials. They look forward to arrange a meeting with you at tascon's booth (booth 12).

August 2011

Meet us at ECASIA

Applications of Surface Analytical Techniques will be discussed during this year's ECASIA meeting in Cardiff (September 4th - 9th; www.eventsforce.net/iop/frontend/reg/thome.csp). Tascon's Hektor Hebert, Daniel Breitenstein and Wolfgang Brock will attend and present our latest results on the characterisation of nanoparticle systems. They look forward to arrange a meeting with you at the booth of our instrument partner IONTOF (booth 6).

March 2011

OTTI Workshop on "Ahesive Bonding of Electronics"

Tascon GmbH will participate on this years OTTI workshop on "Ahesive Bonding of Electronics". The CEO of Tascon, Dr. Birgit Hagenhoff, will discuss the subject area of bonding with respect to the experience of an analytical service provider which deals with optimisation and failure analysis of bonding processes.

November 2010

Inaugural ToF-SIMS / LEIS Workshop at Imperial College

An inaugural ToF-SIMSLEIS workshop will take place on 24th of November, 2010 at the Department of Materials, Imperial College, London, UK. The basics of the analytical techniques and typical applications will be discussed during the workshop. Furthermore the workshop is thought as a platform to intensify the cooperation of research group which are active in this field. Birgit Hagenhoff will participate on this meeting and will report on Tascons experience on the "Characterisation of Nanoparticles by SIMS, LEIS and other techniques: Project NanoPaCT". Further information can be found on the following webpage.

 

September 2010

Tutorial on Time-of-Flight Secondary Ion Mass Spectrometry during SIMS Europe

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is one of the most efficient analytical techniques for the chemical characterisation of solid surfaces. Tascon GmbH will offer a tutorial on the basics and applications of ToF-SIMS in co-operation with the organisers of the SIMS Europe conference. The full-time course will take place in the lecture hall of the Physical Institute of the University Muenster on 19.09.2010 at 09:15. The seminar is designed to meet the needs of ToF-SIMS beginners. The course is free of charge for visitors of the SIMS Europe conference (conference fee: 100€).

June 2010

HS-LEIS as analytical tool for characterisation of heterogeneous catalysts (ECOSS 2010)

Tascon will be present at the 27th European Conference on Surface Science to be held from August 29th to September 3rd 2010 in Groningen, The Netherlands. Dr. Rik ter Veen will give a talk in the session 'Surface chemical reactions and heterogeneous catalysis' on the application of LEIS (Low Energy Ion Scattering) in the study of gamma Al2O3 supported catalysts.

June 2010

CCMX Summer School on Materials Characterisation

Dr. Michael Fartmann will represent Tascon on this years "CCMX Summer School on Materials Characterisation" organised by EPFL in Lausanne. In an oral presentation he will introduce to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) as an extremely flexible analytical tool. Please feel free to contact Dr. Fartmann during the seminar in oder to discuss your surface related analytical issues and how we can help you.

 

May 2010

Workshop of „Competence Centre for Materials Science and Technology“ in Switzerland

Dr. Hagenhoff will give an oral presentation on "Chemical Characterization of Materials Surfaces with TOF‐SIMS" during the workshop "Nanoscale Analytics of Materials for Industrial Applications" in Switzerland on 3. of June.

May 2010

Tascon USA as Exhibitor on Semicon West

Tascon USA will participate on this year's SEMICON West conference in San Francisco, CA. Based on results of a cooperation with National Semiconductor Dr. Albert Schnieders will give a lecture on "Full Wafer Defect Analysis with Time-of-Flight Secondary Ion Mass Spectrometry". Additionally you are heartly invited to visit the Tascon booth (#1150) in order to get in contact with us and our analytical service.

March 2010

SIMS Europe 2010 in Münster

The next SIMS Europe, the leading European conference for exchange in the field of Secondary Ion Mass Spectrometry will take place from September 19 to 21, 2010 and will be co-organised by Tascon GmbH. The conference is suited for experts as well as technicians and scientists who are unfamiliar with the technique. That is why there will be a short course to introduce the principles and applications of SIMS on September 19. The deadline for a contribution is on July 27, 2010. Further information can be found at: SIMS Europe.

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