About us

tascon GmbH was founded in 1997 as a testing laboratory specialising in Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Since then the company has not only developed into an internationally leading laboratory for this technology but also continues to contribute to its development. In our lab, you will find a world wide unique combination of state-of-the-art ToF-SIMS instruments and application knowledge. At the end of 2008 we have expanded our activities to the field of Low Energy Ion Scattering (LEIS). In Summer 2009 we added a profiler for the optical characterisation of surface topography (white light interferometry, confocal microscopy). And since January 2010 X-ray Photoelectron Spectroscopy (XPS) has broadened our instrument portfolio. That enables us to extensively characterise surfaces with variable information depth. If necessary, further surface- and nanoanalytical techniques are at your disposal, offered in co-operation with our partner laboratories.

Currently, a staff of 15 highly qualified employees - 10 being university graduates - takes care of our customers' analytical challenges. Given the variety of our customers` requests, a broad background in experience is important to us. Our staff consists of graduates in physics, chemistry, chemical engineering, biology, biochemistry and geology. They are continuously educating themselves in order to keep the knowledge in the company up to date. This does not only include the analytical techniques, but also production technologies and materials science.

tascon GmbH is an independent, privately owned and operated company.