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      • Analysis of coatings on NMC cathode materials
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tascon GmbH
Mendelstr. 17
48149 Münster

+49-(0)251-625622-100

Logo Tascon Surface Analysis
Skip navigation
  • Home
  • Surface Analysis
    • Methods
      • ToF-SIMS
      • XPS
      • SEM/EDX
      • LEIS
      • Optical Profilometry
      • Other Techniques of Surface Analysis
    • Areas of Application
      • Electronics
      • Plastics
      • Paint and Coatings
      • Glass
      • Pharma
      • Automotive
      • Storage media
      • Life sciences
      • Catalysis
      • Metals
    • Examples
      • Analysis of coatings on NMC cathode materials
      • Analysis of ALD layers
      • Analysis of multilayer systems
      • Coating analysis
      • Spontaneous glass fracture
      • Analysis of discoloration
      • more examples
  • Trouble shooting
  • Consulting
  • Research
  • About us
    • What we do
      • Surface Analysis
      • Multilayer Analysis
      • Development Support
      • Reverse Engineering
      • Failure Analysis
      • Material Analysis
      • Test Laboratory
      • Quality & Process Control
      • Service
    • Münster Laboratory
    • Quality Management
    • Company Logo
  • Contact
    • Imprint
    • Data protection
    • Cookie-Preferences
    • FAQ
 

How may we help you?

  • Tascon
  • Surface Analysis
  • Examples

Make good use of our experience!

The use of surface analytical methods is not bound to specific fields of application or sample geometries. We support you along the entire process chain of your products, from research and development through quality assurance to customer complaints and questions of patent protection. The following links will take you to typical application examples.

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  • Detection of additives
  • Analysis of coatings on NMC cathode materials
  • Analysis of ALD layers
  • Analysis of a contamination on polymers
  • Analysis of multilayer systems
  • Distribution of APIs in tablets
  • Blooming of plastic additives
  • Analysis of printed circuit boards
  • Delamination Analysis of a Layer
  • Analysis of Glass
  • Adhesion Failure Analysis
  • Nanoparticles Analysis
  • Analysis of Corrosion
  • Catalysts Analysis
  • Analysis of Semiconductors
  • Analysis of paint craters
  • Analysis of atomic or molecular monolayers
  • Analysis of organic films
  • Coating analysis
  • Analysis of the oxidation state
  • Polysiloxane Analysis
  • Roughness measurement on surfaces
  • Fouling analysis on surfaces
  • Analysis of contaminant films
  • Spontaneous glass fracture
  • Cleanliness analysis of surfaces
  • Analysis of discoloration
  • RBS and LEIS - A Technique Comparison
  • more examples
 

tascon GmbH
Mendelstr. 17
48149 Münster

Phone:  +49 251 625622-100
Fax: +49 251 625622-101

tascon@tascon-gmbh.de

Ihr Weg zur Tascon via Linkedin / Meet Tascon via Linkedin Ihr Weg zur Tascon via Facebook / Meet Tascon via Facebook

tascon GmbH
Otto-von-Guericke-Ring 13
65205 Wiesbaden

Phone:  +49 6196 5619-119
Fax: +49 6196 5619-145

tascon@tascon-gmbh.de

tascon

Surface analysis
Nano- and microanalysis
Failure analysis
Material analysis
Multilayer analysis
Development support
Process control
Quality control
Reverse engineering

ToF-SIMS Analysis
XPS Analysis
SEM/EDX Analysis
LEIS Analysis
Profilometry

Test laboratory according to
DIN EN ISO/IEC 17025:2005

Management­system according to
ISO 9001:2015

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