tascon News
CCMX Summer School on Materials Characterisation
Dr. Michael Fartmann will represent Tascon on this years "CCMX Summer School on Materials Characterisation" organised by EPFL in Lausanne. In an oral presentation he will introduce to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) as an extremely flexible analytical tool. Please feel free to contact Dr. Fartmann during the seminar in oder to discuss your surface related analytical issues and how we can help you.
Workshop of „Competence Centre for Materials Science and Technology“ in Switzerland
Dr. Hagenhoff will give an oral presentation on "Chemical Characterization of Materials Surfaces with TOF‐SIMS" during the workshop "Nanoscale Analytics of Materials for Industrial Applications" in Switzerland on 3. of June.
Tascon USA as Exhibitor on Semicon West
Tascon USA will participate on this year's SEMICON West conference in San Francisco, CA. Based on results of a cooperation with National Semiconductor Dr. Albert Schnieders will give a lecture on "Full Wafer Defect Analysis with Time-of-Flight Secondary Ion Mass Spectrometry". Additionally you are heartly invited to visit the Tascon booth (#1150) in order to get in contact with us and our analytical service.
SIMS Europe 2010 in Münster
The next SIMS Europe, the leading European conference for exchange in the field of Secondary Ion Mass Spectrometry will take place from September 19 to 21, 2010 and will be co-organised by Tascon GmbH. The conference is suited for experts as well as technicians and scientists who are unfamiliar with the technique. That is why there will be a short course to introduce the principles and applications of SIMS on September 19. The deadline for a contribution is on July 27, 2010. Further information can be found at: SIMS Europe.
New XPS Activity in Frankfurt
Starting January 2010 an experienced team will start our new XPS service in the greater Frankfurt area. We welcome Bernd Bock and Dr. Hektor Hebert who will take care of your analytical problems using new high-end XPS instrumentation.
Contact details:
Taunus-Büro-Zentrum
Geb. Ia
Otto-Volger-Str. 19
65843 Sulzbach/Ts.
Website Relaunch
After years of stand-still on our old web page we now have finished our new web presentation. The new site also allows for customer specific down- and up-loads. Access data can be requested by phone.
HS-LEIS as analytical tool for characterisation of heterogeneous catalysts (ECOSS 2010)
Tascon will be present at the 27th European Conference on Surface Science to be held from August 29th to September 3rd 2010 in Groningen, The Netherlands. Dr. Rik ter Veen will give a talk in the session 'Surface chemical reactions and heterogeneous catalysis' on the application of LEIS (Low Energy Ion Scattering) in the study of gamma Al2O3 supported catalysts.